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PID操作軟件PIDStudio是一個很*的軟件,它非常容易操作和直觀,因為它根據(jù)我們用戶的反饋持續(xù)更新和改進。

產(chǎn)品型號:PIDStudio
更新時間:2024-07-11
廠商性質(zhì):代理商
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PID操作軟件PIDStudio是一個很*的軟件,它非常容易操作和直觀,因為它根據(jù)我們用戶的反饋持續(xù)更新和改進。


通過PIDStudio,可以輸出和比較多個測量的下列參數(shù):

●   并聯(lián)電阻

●   電導(dǎo)率

●   功率損耗

●   泄漏電流

●   溫度

●   濕度

●   高電壓


PID操作軟件主要特點:

●   用戶結(jié)構(gòu)

●   輸出功能

●   譜圖

●   通過和失敗標準

●   分析功能包

●   可控制任意數(shù)量的設(shè)備



參考文獻: cells  (1)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Local corrosion of silicon as root cause for potential induced  degradation at the rear side of bifacial PERC solar cells. physica status solidi (RRL)–Rapid Research Letters. 2019, doi 10.1002/pssr.201900163

(2)V. Naumann, K. Ilse, M. Pander, J. Tr?ndle, K. Sporleder, C. Hagendorf, Influence of soiling and moisture ingress on long term PID susceptibility of photovoltaic

modules, AIP Conference Proceedings 2147, 090005 (2019).

(3)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Root cause analysis on corrosive potential-induced degradation effects  at the rear side of bifacial silicon PERC solar cells, Solar Energy Materials and Solar Cells 201, 110062 (2019).

(4)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells

as Root Cause of Potential‐Induced Degradation at the Rear Side, Phys. Status Solidi A (2019), doi:10.1002/pssa.201900334.

(5)K. Sporleder, J. Bauer, S. Gro?er, S. Richter, A. H?hnel, M. Turek, V. Naumann, K. Ilse, C. Hagendorf, Potential-Induced Degradation of Bifacial PERC Solar Cells Under  Illumination, IEEE Journal of Photovoltaics 9 (6) 1522-1525, 2019.

(6)K. Sporleder, M. Turek, N. Schüler, V. Naumann, D. Hevisov, C. P?blau, S. Gro?er, H. Schulte-Huxel, J. Bauer, C. Hagendorf, Quick test for reversible and irreversible  PID of bifacial PERC solar cells, Solar Energy Materials and Solar Cells 219, 110755, 2021.

(7)K. Sporleder, V. Naumann, J. Bauer, D. Hevisov, M. Turek, and C. Hagendorf, Time-resolved Investigation of Transient Field Effect Passivation States during Potential  Induced Degradation and Recovery of Bifacial Silicon Solar Cells , Solar RRL, 2021, accepted.




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